IC circuit analysis is performed by specialists in each field, both analog and digital. Uniform membrane delayering technology without wiring and Via defects is essential for analysis. We have delayering expertise for each type of ICs such as various analog ICs, mixed signal ICs, RF ICs, image sensors, advanced processors (down to a few nm), memories, etc. As an option, we provide a proprietary Viewer tool developed by LTEC Corporation. You can use this tool to trace the interconnect path in each physical layer of the PCB and cross-reference each component to the schematic.

We can extract circuit schematic diagram and interconnect line/space/thickness, etc. by delayering. The image of each layer is included in a standard analysis report. While most requests are for PCBs of onboard devices, we also have an extensive track record in analyzing high-density mounting PCBs (smartphones), and ceramic PCBs (radio frequency equipment, camera modules). It is also possible to analyze resin encapsulated products, advanced multi-layer products having sixteen buildup layers16-layer boards, 2.5D, 3D integrated products, and chiplet structures. We can investigate operation, components used, circuit/system operation, design ideas, thermal, EMC properties, etc.

We offer intellectual property-related technical services that combine technical prior art document search and semiconductor product analysis.

We support our customers in intellectual property departments and R&D with our signal acquisition services.

We analyze several dozen panels annually. We have the expertise required for panel analysis, including the measurement of optical properties such as brightness and illuminance. We perform product tear down in a non-destructive manner, acquire drive voltages by probing to inside the panel, separation of PCBs laminated with films and thin-film glass, etc.

We not only search for domestic and foreign prior art documents but also non-patent documents, scientific papers, journals in selected fields, corporate news releases, product specifications, etc. We compare our prior art search results conducted by highly qualified engineers and researchers with the technical data obtained by analyzing relevant products of interest. We provide total support for the protection and utilization of intellectual property with our diverse analysis menu lineup.